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Volumn 13, Issue 2 I, 2003, Pages 809-812

A novel multilayer process for HTS SFQ circuit

Author keywords

HTS SFQ circuit; Interface engineered junction; NdBa2Cu 3O7 d; Ring oscillator

Indexed keywords

INDUCTANCE MEASUREMENT; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; LOGIC CIRCUITS; MULTILAYERS; SOLID STATE OSCILLATORS;

EID: 0042942762     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.814050     Document Type: Conference Paper
Times cited : (20)

References (10)
  • 1
    • 0026116572 scopus 로고
    • RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital systems
    • March
    • K. K. Likharev and V. K. Semenov, "RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital systems," IEEE Trans. Appl. Supercond., vol. 1, pp. 3-28, March 1991.
    • (1991) IEEE Trans. Appl. Supercond. , vol.1 , pp. 3-28
    • Likharev, K.K.1    Semenov, V.K.2
  • 2
  • 5
    • 0027646763 scopus 로고
    • Phase diagrams of Ln-Ba-Cu-O systems (Ln = Lanthanide)
    • K. Osamura and W. Zhang, "Phase diagrams of Ln-Ba-Cu-O systems (Ln = Lanthanide)," Z. Metaqallkd., vol. 84, pp. 522-528, 1993.
    • (1993) Z. Metaqallkd. , vol.84 , pp. 522-528
    • Osamura, K.1    Zhang, W.2
  • 8
    • 0031169775 scopus 로고    scopus 로고
    • Study of in-situ prepared high-temperature superconducting edge-type Josephson junctions
    • June
    • T. Satoh, M. Hidaka, and S. Tahara, "Study of in-situ prepared high-temperature superconducting edge-type Josephson junctions," IEEE Trans. Appl. Supercond., vol. 7, pp. 3001-3004, June 1997.
    • (1997) IEEE Trans. Appl. Supercond. , vol.7 , pp. 3001-3004
    • Satoh, T.1    Hidaka, M.2    Tahara, S.3
  • 10
    • 0032671698 scopus 로고    scopus 로고
    • Measurement of the error rate of single flux quantum circuits with high temperature superconductors
    • June
    • B. Ruck, Y. Chong, R. Dittmann, A. Engelhardt, B. Oelze, E. Sodtke, and M. Siegel, "Measurement of the error rate of single flux quantum circuits with high temperature superconductors," IEEE Trans. Appl. Supercond., vol. 9, pp. 3850-3853, June 1999.
    • (1999) IEEE Trans. Appl. Supercond. , vol.9 , pp. 3850-3853
    • Ruck, B.1    Chong, Y.2    Dittmann, R.3    Engelhardt, A.4    Oelze, B.5    Sodtke, E.6    Siegel, M.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.