Analysis of amorphous and oxide surface layers on nanoparticles

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 412-413

  Perrey, Christopher R ^a   Carter, C Barry ^a   Bentley, James ^b   Lentzen, Markus ^c  

^a UNIVERSITY OF MINNESOTA   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042924225     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603442062     Document Type: Conference Paper

References (7)

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2. C.R. Perrey, et al., Mater. Res. Soc. Symp. Proc., 740 (2002), in press.
3. W.W. Gerberich, et al., J. Mech. Phys. Solids, (2003), in press.
4. M. Haider, et al., Nature, 392 (1998) 768.
5. M. Haider, et al., Ultramicroscopy, 75 (1998) 53.
6. M. Lentzen, et al., Ultramicroscopy, 92 (2002) 233.
7. C.L. Jia, M. Lentzen, and K. Urban, Science, 299 (2003) 870.