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Volumn 21, Issue 5, 2002, Pages 363-379

Determining operating criterion of batch processing operations for wafer fabrication

Author keywords

Batch processing; Batch processing policy; Queuing; Semiconductor manufacturing; Simulation

Indexed keywords


EID: 0042871637     PISSN: 02786125     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0278-6125(02)80035-8     Document Type: Article
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.