An overview of low-frequency noise in advanced CMOS/SOI transistors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5113, Issue , 2003, Pages 159-167

  Jomaah, Jalal ^a   Balestra, Francis ^a  

^a GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

Author keywords

Carrier number fluctuations; DTMOS; Kink related excess noise; Low frequency noise; SOI

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; ELECTRIC POTENTIAL; LIMITERS; SPURIOUS SIGNAL NOISE;

KINK-RELATED EXCESS NOISE; LOW FREQUENCY NOISE; MIXED SIGNAL CIRCUITS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0042825683     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.487717     Document Type: Conference Paper

References (10)

1. A.K. Agarwal, M. C. Driver, M. H. Hanes, H. M. Hodgood, P. G. McMullin, H. C. Nathanson, T. W. O'Keeffe, T. J. Smith, J. R. Szedon and R. N. Thomas, "MICROX™ - An advanced silicon technology for microwave circuits up to X-band," in Proc. IEDM Tech. Dig., pp. 687-690, Dec. 91.
2. D. Eggert, P. Huelber, A. Huerrich, H. Kuerck, W. Budde and M. Vorwerk, "A SOI-RF-CMOS technology on high resistivity SIMOX substrates for microwave applications to 5 GHz." IEEE Trans. on Electron Devices, vol. 44, no. 11, pp. 1981-1989, Nov. 97.
3. O. Rozeau, J. Jomaah, S. Haendler, J. Boussey, and F. Balestra, "SOI Technologies Overview for Low-Power Low-Voltage Radio-Frequency Applications", Analog Integrated Circuits and Signal Processing, 25, 2000, Kluwer Academic Publishers - Special issue of SOI.
4. McWhorter A.L., Semiconductor Surface Physics, University of Pennsylvania Press, Philadelphia 1957.
5. G. Ghibaudo, O. Roux, Ch. Nguyen-Duc, F. Balestra, and J. Brini, "Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors", phys. stat. sol. (a) 124, p. 571, 1991.
6. S. Christensson, I. Lundstrom and C. Svensson, "Low-frequency noise in MOS transistors-I", Sol. State Elec., 11, pp. 797-812, 1968.
7. R. Kolarova, T. Skotnicki, and J.A. Chroboczek, "Low-frequency noise in thin gate oxide MOSFETs", Mic. Rel., 41, pp.579-585, 2000.
8. E. Simeon, U. Magnusson, A.L.P. Rotondaro, and C. Claeys, "The kink-related excess low-frequency noise in silicon-on-insulator MOST's", IEEE EDL, vol. 41, pp. 330-339, March 1994.
9. Y.-C. Tseng, W.M. Huang, P.J. Welch, J.M. Ford, and J.C.S. Woo., "Empirical correlation between AC kink and low frequency noise overshoot in SOI MOSFETs", IEEE EDL, vol. 19, no 5, pp. 157-159, May 1998.
10. S. Haendler, J. Jomaah, G. Ghibaudo and F. Balestra, "Improved Analysis of Low Frequency Noise in Dynamic Threshold (DT) MOS/SOI Transistors", Microelectron. Reliab. Journal, 41, pp. 855-860, 2001