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Volumn 36, Issue 15, 2003, Pages 1842-1849

Phase-stepping optical profilometry of atom mirrors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DEFORMATION; ELECTRODES; INTERFEROMETERS; PROFILOMETRY; SINGLE CRYSTALS;

EID: 0042734538     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/15/315     Document Type: Article
Times cited : (13)

References (23)
  • 14
    • 0042947030 scopus 로고    scopus 로고
    • PhD Thesis Delft University of Technology, The Netherlands
    • Vdovin G 1996 PhD Thesis Delft University of Technology, The Netherlands
    • (1996)
    • Vdovin, G.1
  • 23
    • 0041945398 scopus 로고    scopus 로고
    • Virginia Semiconductor Inc. Fredericksburg, VA 22401-4647, USA, Private communication
    • Virginia Semiconductor Inc. Fredericksburg, VA 22401-4647, USA, Private communication


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.