Mechanical properties of ultra-thin single crystals for atom-mirror applications: Au(001), Si(001)

Journal of Physics D: Applied Physics

Volumn 32, Issue 20, 1999, Pages 2666-2673

  Holst, B ^a,b   Huntley, J M ^a,c   Balsod, R ^a   Allison, W ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b MAX PLANCK INSTITUTE FOR DYNAMICS AND SELF ORGANIZATION   (Germany)

^c LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC BEAMS; COMPUTER SIMULATION; DEFORMATION; ELECTROSTATICS; GOLD; HELIUM; INTERFEROMETRY; MECHANICAL PROPERTIES; PRESSURE; SEMICONDUCTING SILICON; SINGLE CRYSTALS; STRESSES;

ATOM MIRROR; PHASE STEPPING INTERFEROMETRY; ULTRATHIN SINGLE CRYSTAL;

ULTRATHIN FILMS;

EID: 0342733643     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/20/313     Document Type: Article

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