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Volumn 509, Issue 1-3, 2003, Pages 191-199

Multilayer thin-film technology enabling technology for solving high-density interconnect and assembly problems

(1)  Beyne, Eric a  

a IMEC   (Belgium)

Author keywords

CSP; Flip chip; MCM; Multilayer thin film; RF

Indexed keywords

FLIP CHIP DEVICES; INTEGRATED CIRCUITS; MICROELECTRONICS; MULTILAYERS;

EID: 0042729971     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01570-5     Document Type: Conference Paper
Times cited : (8)

References (16)
  • 1
    • 0041564406 scopus 로고    scopus 로고
    • http://public.itrs.net/.
  • 5
    • 0038273484 scopus 로고
    • The use of BCB and photo-BCB dielectrics for high speed digital and microwave applications
    • Denver, Colorado, April 19-21
    • E. Beyne, R. Van Hoof, A. Achen, The use of BCB and photo-BCB dielectrics for high speed digital and microwave applications, Proceedings of the 1995 International Conference on Multichip Modules, Denver, Colorado, April 19-21, 1995, pp. 513-518.
    • (1995) Proceedings of the 1995 International Conference on Multichip Modules , pp. 513-518
    • Beyne, E.1    Van Hoof, R.2    Achen, A.3
  • 7
    • 0041564400 scopus 로고    scopus 로고
    • Bond pad pitch reduction down to 40 μm: Influence on solder joint fatigue for flip chip structures
    • Paris, France, 15-17 April
    • D. Degryse, R. Labie, B. Vandevelde, M. Gonzalez, E. Beyne, Bond pad pitch reduction down to 40 μm: influence on solder joint fatigue for flip chip structures, Proceedings of EuroSIME 2002, Paris, France, 15-17 April, pp. 316-321.
    • (2002) Proceedings of EuroSIME 2002 , pp. 316-321
    • Degryse, D.1    Labie, R.2    Vandevelde, B.3    Gonzalez, M.4    Beyne, E.5
  • 11
    • 0033365188 scopus 로고    scopus 로고
    • On the use of bare-die field programmable devices in miniaturized systems
    • Denver, CO, USA, 7-9 April
    • C. Truzzi, E. Beyne, On the use of bare-die field programmable devices in miniaturized systems, Proceedings IMAPS HDP and Proceedings of the SPIE, Vol. 3830, Denver, CO, USA, 7-9 April 1999, pp. 120-125.
    • (1999) Proceedings IMAPS HDP and Proceedings of the SPIE , vol.3830 , pp. 120-125
    • Truzzi, C.1    Beyne, E.2
  • 13
    • 0035714371 scopus 로고    scopus 로고
    • Technologies for very high bandwidth electrical interconnects between next generation VLSI circuits
    • Washington, D.C., S23-p3, December 2-5
    • E. Beyne, Technologies for very high bandwidth electrical interconnects between next generation VLSI circuits, IEEE-IEDM 2001 Technical Digest, Washington, D.C., S23-p3, December 2-5, 2001.
    • (2001) IEEE-IEDM 2001 Technical Digest
    • Beyne, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.