Low thermal power electron beam annealing of scanning tunneling microscope tips

Review of Scientific Instruments

Volumn 68, Issue 8, 1997, Pages 3262-3263

  Scholz, R ^a   Agne, M ^a   Breitenstein, O ^a   Jenniches, H ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039676384     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148279     Document Type: Article

References (4)

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2. M. Johnson, O. Albrektsen, R. M. Feenstra, and H. W. M. Salemink, Appl. Phys. Lett. 63, 2923 (1993).
3. A. Wiessner, G. Schäfer, Th. Berghaus, and J. Kirschner (unpublished).
4. G. Cox, K. H. Graf, D. Szynka, U. Poppe, and K. Urban, Vacuum 41, 591 (1990).