High temperature reliability on automotive power modules verified by power cycling tests up to 150°C

Microelectronics Reliability

Volumn 43, Issue 9-11, 2003, Pages 1871-1876

  Coquery, G ^a   Lefranc, G ^b   Licht, T ^c   Lallemand, R ^a   Seliger, N ^b   Berg, H ^c  

^a Lab des Technologies Nouvelles   (France)

^b SIEMENS AG   (Germany)

^c Eupec GmbH and Co KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INVERTERS; INTERNAL COMBUSTION ENGINES; MOSFET DEVICES; WATER COOLING SYSTEMS;

AUTOMOTIVE POWER MODULES;

AUTOMOTIVE ENGINEERING;

EID: 0042694303     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00318-4     Document Type: Conference Paper

References (6)

1. Coquery G, Carubelli S, Ousten J.P, Lallemand R, Lecoq F, Lhotellier D, De Viry V, Dupuy Ph, Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. Microelectronics Reliability, 41 (2001) 1695-1700.
2. Lefranc G Licht T, Schultz H.J, Beinert R, Mitic G, Reliability testing of high-power multi-chip IGBT modules, Microelectronics Reliability, 40 (2000) 1659-1663.
3. Ciappa M, Carbognani F, Cova P, Fichtner W. A novel thermomechanics-based lifetime prediction model for cycle fatigue failure mechanisms in power semiconductors. Microelectronics Reliability, 42 (2002) 1653-1658.
4. Schubert A, Walter H, Dudek R, Michel B, Lefranc G, Otto J, Mitic G, Thermomechanical properties and creep deformation of lead-containing and lead-free solders. Proc. of 34th International Symposium on Microelectronics, IMAPS 2001, Oct. 9-11, Baltimore, MD
5. Seliger N, Wolfgang E, Lefranc G, Berg H, Licht T Reliable power electronics for automotive applications. Microelectronics Reliability, 42 (2002) 1597-1604.
6. Coquery G, Lallemand R, Failure criteria for long term accelerated power cycling test linked to electrical turn off SOA on IGBT module. A 4000 hours test on 1200A-3300V Module with AlSiC base plate. Microelectronics Reliability 40 (2000) 1665-1670.