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Volumn , Issue , 1999, Pages
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Nose-to-nose response of a 20-GHz sampling circuit
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Author keywords
[No Author keywords available]
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Indexed keywords
CIRCUIT SIMULATION;
MICROWAVE MEASUREMENT;
TIMING CIRCUITS;
NOSE TO NOSE CALIBRATION;
OPERATIONAL CONDITIONS;
RESPONSE FUNCTIONS;
SAMPLING CIRCUITS;
SPICE SIMULATIONS;
SPICE;
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EID: 0008286383
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.1999.327365 Document Type: Conference Paper |
Times cited : (11)
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References (4)
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