Effects of nonlinear diode junction capacitance on the nose-to-nose calibration

IEEE Microwave and Wireless Components Letters

Volumn 11, Issue 5, 2001, Pages 196-198

  Remley, Kate A ^a,b   Williams, Dylan F ^a,b   DeGroot, Donald C ^a,b   Verspecht, Jan ^c   Kerley, John ^a,d  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c AGILENT TECHNOLOGIES   (Belgium)

^d AGILENT TECHNOLOGIES   (United States)

Author keywords

Digital sampling oscilloscope; Nose to nose calibration; Phase error; Samplers

Indexed keywords

DIGITAL SAMPLING OSCILLOSCOPE; NONLINEAR DIODE JUNCTION CAPACITANCE EFFECTS; NOSE TO NOSE CALIBRATION;

CALIBRATION; CAPACITANCE; CATHODE RAY OSCILLOSCOPES; COMPUTER SIMULATION; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; NUMERICAL METHODS; SEMICONDUCTOR JUNCTIONS; SPURIOUS SIGNAL NOISE;

SEMICONDUCTOR DIODES;

EID: 0035351874     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/7260.923026     Document Type: Letter

References (9)

1. Characterizing high-speed oscilloscopes
2. Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure
3. Broadband sampling oscilloscope characterization with the 'nose-to-nose' calibration procedure: A theoretical and practical analysis
4. Nose-to-nose response of a 20-GHz sampling circuit
5. Estimating the magnitude and phase response of a 50 GHz sampling oscilloscope using the "Nose-to-Nose" method
6. Analytic model for a sampling circuit
7. Modeling of the HP-1430A feedthrough wideband (28-ps) sampling head
8. Realistic sampling-circuit model for a nose-to-nose calibration