Modeling and simulation of the tool wear in nanometric cutting

Wear

Volumn 255, Issue 7-12, 2003, Pages 1427-1432

  Cheng, K ^a   Luo, X ^a   Ward, R ^a   Holt, R ^a  

^a LEEDS METROPOLITAN UNIVERSITY   (United Kingdom)

Author keywords

AFM; Molecular dynamics; Nanometric cutting; Tool wear

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CUTTING TOOLS; MOLECULAR DYNAMICS; STRESSES;

TOOL WEAR;

WEAR OF MATERIALS;

CUTTING; DIAMOND TOOL; TEMPERATURE EFFECT; TOOL WEAR;

EID: 0042564656     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(03)00178-9     Document Type: Article

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