On the electrical and optical properties of the stratified tellurium thin films

Journal of Optoelectronics and Advanced Materials

Volumn 3, Issue 4, 2001, Pages 867-872

  Rusu, M ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

Electrical properties; Optical properties; Tellurium; Thin films; X ray diffraction

Indexed keywords

BOND STRENGTH (CHEMICAL); ELECTRIC PROPERTIES; FILM GROWTH; OPTICAL PROPERTIES; SUBSTRATES; TELLURIUM; TELLURIUM COMPOUNDS; THERMAL EVAPORATION; VACUUM EVAPORATION; X RAY DIFFRACTION;

ANISOTROPIC PROPERTY; CRYSTALLITE ORIENTATION; ELECTRICAL AND OPTICAL PROPERTIES; FILM MICROSTRUCTURES; FILM STRUCTURE; GLASS SUBSTRATES; IR SPECTRAL RANGE; OPTICAL PARAMETER;

THIN FILMS;

EID: 0042525212     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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