On thickness dependence of electrical and optical properties of Te thin films

Applied Physics A: Materials Science and Processing

Volumn 66, Issue 3, 1998, Pages 357-361

  Rusu, M ^a  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; EVAPORATION; MATHEMATICAL MODELS; OPTICAL PROPERTIES; SUBSTRATES; TELLURIUM; THIN FILMS; VACUUM APPLICATIONS; X RAY CRYSTALLOGRAPHY;

CRYSTAL STRUCTURE MODEL; CRYSTAL SUBLAYER THICKNESS;

POLYCRYSTALLINE MATERIALS;

EID: 0032011157     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050678     Document Type: Article

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