Structural and morphological characterisation of heteroepitaxial CeO 2 films grown on YSZ (100) and TiO2 (001) by metal-organic chemical vapour deposition

Materials Science and Engineering: B

Volumn 102, Issue 1-3, 2003, Pages 323-326

  Lo Nigro, R ^b   Malandrino, G ^a   Fragala I L ^a  

^a UNIVERSITY OF CATANIA   (Italy)

^b CNR IMM   (Italy)

Author keywords

Buffer layers; Cerium dioxide; Epitaxy; Metal organic chemical vapour deposition; Rutile

Indexed keywords

CERIUM COMPOUNDS; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; X RAY DIFFRACTION ANALYSIS;

LATTICE MISMATCH;

THIN FILMS;

EID: 0042512494     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00646-3     Document Type: Conference Paper

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