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Thin Solid Films

Volumn 441, Issue 1-2, 2003, Pages 63-71

Microstructural evolution in Al-Cu-Fe quasicrystalline thin films

(2) Widjaja, E J a Marks, L D a

a Northwestern University (United States)

Author keywords

Al Cu Fe; Microstructural evolution; Quasicrystalline thin films; Transmission electron microscopy (TEM)

Indexed keywords

ALUMINUM; AMORPHOUS MATERIALS; ARGON; FILM GROWTH; GRAIN BOUNDARIES; IMAGING TECHNIQUES; MAGNETRON SPUTTERING; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHASE TRANSITIONS; QUASICRYSTALS; SODIUM CHLORIDE; TRANSMISSION ELECTRON MICROSCOPY;

MICROSTRUCTURAL EVOLUTION;

THIN FILMS;

EID: 0042510000 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(03)00903-9 Document Type: Article

Times cited : (20)

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