Formation of a decagonal quasicrystalline film by reactive diffusion in Al/Co multilayers

Philosophical Magazine Letters

Volumn 78, Issue 2, 1998, Pages 77-85

  Embric, E ^a,b   Bergman, C ^a   Glugnet, G ^b   Gas, P ^b   Audier, M ^c  

^a du 141eme RIA   (France)

^b AIX MARSEILLE UNIVERSITY   (France)

^c Ecole Nationale Superieure de Physique de Grenoble   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ANNEALING; DIFFERENTIAL SCANNING CALORIMETRY; DIFFUSION IN SOLIDS; ELECTRIC RESISTANCE MEASUREMENT; FILM GROWTH; METALLIC SUPERLATTICES; PHASE TRANSITIONS; QUASICRYSTALS; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

QUASICRYSTALLINE FILMS;

METALLIC FILMS;

EID: 0032135956     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008398178057     Document Type: Article

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