메뉴 건너뛰기




Volumn 42, Issue 10, 2003, Pages 1809-1813

Theoretical measurement uncertainty of white-light interferometry on rough surfaces

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT INTERFERENCE; OPTICAL CORRELATION; PROFILOMETRY; SPECKLE; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

EID: 0042476624     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.001809     Document Type: Article
Times cited : (32)

References (15)
  • 1
    • 84975646278 scopus 로고
    • Three-dimensional sensing of rough surfaces by coherence radar
    • T. Dresel, G. Häusler, and H. Venzke, “Three-dimensional sensing of rough surfaces by coherence radar,” Appl. Opt. 31, 919-925 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 919-925
    • Dresel, T.1    Häusler, G.2    Venzke, H.3
  • 2
    • 0003371059 scopus 로고    scopus 로고
    • Limits of optical range sensors and how to exploit them
    • T. Asakura, ed, Springer Series in Optical Sciences, Springer Verlag, Berlin
    • G. Hausler, P. Ettl, M. Schenk, C. Bohn, and I. Laszlo, “Limits of optical range sensors and how to exploit them,” in International Trends in Optics and Photonics ICO IV, T. Asakura, ed., Vol. 74 of Springer Series in Optical Sciences, (Springer Verlag, Berlin, 1999), pp. 328-342.
    • (1999) International Trends in Optics and Photonics ICO IV , vol.74 , pp. 328-342
    • Hausler, G.1    Ettl, P.2    Schenk, M.3    Bohn, C.4    Laszlo, I.5
  • 3
    • 0001120025 scopus 로고    scopus 로고
    • Low-coherence interferometry with synthesis of coherence function
    • Y. Teramura, K. Suzuki, and F. Kannari, “Low-coherence interferometry with synthesis of coherence function,” Appl. Opt. 38, 5974-5980 (1999).
    • (1999) Appl. Opt. , vol.38 , pp. 5974-5980
    • Teramura, Y.1    Suzuki, K.2    Kannari, F.3
  • 4
    • 0027639146 scopus 로고
    • Interferometric profiler for rough surfaces
    • P. J. Caber, “Interferometric profiler for rough surfaces,” Appl. Opt. 32, 3438-3441 (1993).
    • (1993) Appl. Opt. , vol.32 , pp. 3438-3441
    • Caber, P.J.1
  • 5
    • 0028545665 scopus 로고
    • High-speed noncontact profiler based on scanning white-light interferometry
    • L. Deck and P. de Groot, “High-speed noncontact profiler based on scanning white-light interferometry,” Appl. Opt. 33, 7334-7338 (1994).
    • (1994) Appl. Opt , vol.33 , pp. 7334-7338
    • Deck, L.1    De Groot, P.2
  • 6
    • 0000054238 scopus 로고    scopus 로고
    • Efficient nonlinear algorithm for envelope detection in white light interferometry
    • K. G. Larkin, “Efficient nonlinear algorithm for envelope detection in white light interferometry,” J. Opt. Soc. Am. A 13, 832-843 (1996).
    • (1996) J. Opt. Soc. Am. A , vol.13 , pp. 832-843
    • Larkin, K.G.1
  • 7
    • 0033749508 scopus 로고    scopus 로고
    • Direct quadratic polynomial fitting for fringe peak detection of white light scanning interfero-grams
    • M. C. Park and S. W. Kim, “Direct quadratic polynomial fitting for fringe peak detection of white light scanning interfero-grams,” Opt. Eng. 39, 952-959 (2000).
    • (2000) Opt. Eng. , vol.39 , pp. 952-959
    • Park, M.C.1    Kim, S.W.2
  • 9
    • 0002068881 scopus 로고
    • Statistical properties of laser speckle patterns
    • J. C. Dainty, ed. (Springer-Verlag, Berlin
    • J. W. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, Berlin, 1984), pp. 9-75.
    • (1984) Laser Speckle and Related Phenomena , pp. 9-75
    • Goodman, J.W.1
  • 10
    • 0032185918 scopus 로고    scopus 로고
    • Speckle decorelation in surface profilometry by wavelength scanning interferometry
    • I. Yamaguchi, A. Yamamoto, and S. Kuwamura, “Speckle decorelation in surface profilometry by wavelength scanning interferometry,” Appl. Opt. 37, 6721-6728 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 6721-6728
    • Yamaguchi, I.1    Yamamoto, A.2    Kuwamura, S.3
  • 11
    • 0001336075 scopus 로고    scopus 로고
    • Surface roughness measurement based on the intensity correlation function of scattered light under speckle pattern illumination
    • P. Lehmann, “Surface roughness measurement based on the intensity correlation function of scattered light under speckle pattern illumination,” Appl. Opt. 39, 1144-1152 (1999).
    • (1999) Appl. Opt. , vol.39 , pp. 1144-1152
    • Lehmann, P.1
  • 12
    • 0042353576 scopus 로고    scopus 로고
    • Physikalische Grenzen der optischen Formerfassung mit Licht
    • G. Hausler and G. Leuchs, “Physikalische Grenzen der optischen Formerfassung mit Licht,” Phys. Bl. 53, 417-422 (1997).
    • (1997) Phys. Bl. , vol.53 , pp. 417-422
    • Hausler, G.1    Leuchs, G.2
  • 13
    • 0015639448 scopus 로고
    • Speckle reduction using multiple tones of illumination
    • N. George and A. Jain, “Speckle reduction using multiple tones of illumination,” Appl. Opt. 12, 1202-1212 (1973).
    • (1973) Appl. Opt. , vol.12 , pp. 1202-1212
    • George, N.1    Jain, A.2
  • 14
    • 0000566137 scopus 로고    scopus 로고
    • Theoretical limits of scanning white-light interferometry signal evaluation algorithms
    • M. Fleischer, R. Windecker, and H. J. Tiziani, “Theoretical limits of scanning white-light interferometry signal evaluation algorithms,” Appl. Opt. 40, 2815-2820 (2001).
    • (2001) Appl. Opt. , vol.40 , pp. 2815-2820
    • Fleischer, M.1    Windecker, R.2    Tiziani, H.J.3
  • 15
    • 0028403126 scopus 로고
    • Laser triangulation: Fundamental uncertainty in distance measurement
    • R. G. Dorsch, G. Ha usler, and J. M. Herrmann, “Laser triangulation: fundamental uncertainty in distance measurement,” Appl. Opt. 33, 1306-1314 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 1306-1314
    • Dorsch, R.G.1    Ha Usler, G.2    Herrmann, J.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.