Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms

Optical Engineering

Volumn 39, Issue 4, 2000, Pages 952-959

  Park, Min Cheol ^a   Kim, Seung Woo ^a,b,c,d  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b CRANFIELD UNIVERSITY   (United Kingdom)

^c Lab of Prec Eng and Metrology   (South Korea)

^d ASME

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT QUADRATIC POLYNOMIAL FITTING; WHITE LIGHT SCANNING INTERFEROMETRY;

COMPUTATIONAL METHODS; CURVE FITTING; LEAST SQUARES APPROXIMATIONS; LIGHT INTERFERENCE; LIGHT REFLECTION; POLYNOMIALS; SCANNING; THREE DIMENSIONAL COMPUTER GRAPHICS;

INTERFEROMETRY;

EID: 0033749508     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.602445     Document Type: Article

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