Positron beam analysis of structurally ordered porosity in mesoporous silica thin films

Materials Science and Engineering: B

Volumn 102, Issue 1-3, 2003, Pages 2-7

  Van Veen, A ^a   Galindo, R Escobar ^a   Schut, H ^a   Eijt, S W H ^a   Falub, C V ^a   Balkenende, A R ^b   De Theije, F K ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Annihilation; Pores and percolation phenomena; Positronium; Positrons; Silica

Indexed keywords

DIELECTRIC FILMS; MECHANICAL PERMEABILITY; PERCOLATION (SOLID STATE); POROSITY; POSITRONS; SILICA; THIN FILMS; TRANSPORT PROPERTIES;

PARTICLE ANNIHILATIONS;

MESOPOROUS MATERIALS;

EID: 0042431984     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00752-3     Document Type: Conference Paper

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