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Volumn 94, Issue 4, 2003, Pages 2746-2748

Thermal strain in indium phosphide on silicon obtained by epitaxial lateral overgrowth

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; SEMICONDUCTING SILICON; STRAIN; TENSILE STRENGTH; VAPOR PHASE EPITAXY;

EID: 0042423606     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1593213     Document Type: Article
Times cited : (21)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.