Raman scattering as a probe of crystallinity in PTCDA and H2Pc single-layer and double-layer thin film heterostructures

Journal of Physical Chemistry B

Volumn 107, Issue 16, 2003, Pages 3782-3788

  Heutz, S ^a   Salvan, G ^b   Silaghi, S D ^b   Jones, T S ^a   Zahn, D R T ^b  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

^b CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; HETEROJUNCTIONS; PHONONS; POLARIZATION; RAMAN SCATTERING; RESONANCE;

MICROCRYSTALLITES; SINGLE LAYER FILMS; TEMPLATED STRUCTURES; VIBRATIONAL PROPERTIES;

THIN FILMS;

EID: 0042245247     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0266392     Document Type: Article

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