Observation of tilted or wedge-shaped subsurface defects and their nondestructive evaluation by photoacoustic microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 5 B, 2003, Pages 3052-3053

  Endoh, Haruo ^a   Miyamoto, Katsuhiko ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

NDT; PA cell; PA imaging; Photoacoustic microscopy (PAM); Subsurface defect; Tilted subsurface defect

Indexed keywords

DEFECTS; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION; SIGNAL PROCESSING; SURFACE PROPERTIES;

MECHANICAL PROCESSING; PHOTOACOUSTIC MICROSCOPY; SIGNAL INTENSITY DISTRIBUTION; SUBSURFACE DEFECTS;

PHOTOACOUSTIC EFFECT;

EID: 0042243612     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.3052     Document Type: Article

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