Observation of branched complicated defect and its nondestructive evaluation by photoacoustic microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 5 B, 2001, Pages 3604-3605

  Endoh, Haruo ^a   Yaegashi, Naoto ^a   Hiwatashi, Yoichiro ^a   Hoshimiya, Tsutomu ^a  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

Author keywords

Branched complicated defect; NDE; PA imaging; Photoacoustic microscopy (PAM)

Indexed keywords

CRACKS; DRILLING; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; NONDESTRUCTIVE EXAMINATION; PHOTOACOUSTIC EFFECT; SURFACE PROPERTIES; THERMAL DIFFUSION;

PHOTOACOUSIC MICROSCOPY; SURFACE DEFECTS;

STRUCTURAL ANALYSIS;

EID: 0035328099     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.3604     Document Type: Article

References (6)