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Volumn 356, Issue 1-2, 2003, Pages 8-16

Effect of an electric field on microstructure coarsening in 60Sn40Pb solder joints

Author keywords

Electric field; Kinetics; Microstructure coarsening; Phase size distribution

Indexed keywords

ANNEALING; DIFFUSION; ELECTRIC FIELD EFFECTS; EUTECTICS; MICROSTRUCTURE; SOLDERED JOINTS;

EID: 0041972701     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00851-1     Document Type: Article
Times cited : (9)

References (27)
  • 18
    • 0004123565 scopus 로고
    • R.J. DeHoff, F.N. Rhines (Eds.), McGraw-Hill, New York
    • F. Schückher, in: R.J. DeHoff, F.N. Rhines (Eds.), Quantitative Microscopy, McGraw-Hill, New York, 1968, pp. 201-213.
    • (1968) Quantitative Microscopy , pp. 201-213
    • Schückher, F.1
  • 21
    • 0006100925 scopus 로고
    • G. Lorimer (Ed.), TMS, Warrendale, PA
    • A.J. Ardell, in: G. Lorimer (Ed.), Phase Transformations'87, TMS, Warrendale, PA, 1988, pp. 485-494.
    • (1988) Phase Transformations'87 , pp. 485-494
    • Ardell, A.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.