Influence of surface morphology of the polycrystalline silicon on field electron emission

Thin Solid Films

Volumn 337, Issue 1-2, 1999, Pages 261-265

  Evtukh, Anatoli A ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Asperities; Field electron emission; Polycrystalline silicon

Indexed keywords

EID: 0041969685     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01386-8     Document Type: Article

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