Application of variable Cs HRTEM to the study of nanoscale structures

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 958-959

  Perrey, Christopher R ^a   Carter, C Barry ^a   Lentzen, Markus ^b  

^a UNIVERSITY OF MINNESOTA   (United States)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041920824     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444796     Document Type: Conference Paper

References (6)

1. D.B. Williams and C.B. Carter, Transmission Electron Microscopy, Plenum, New York, 1996.
2. K. Urban and M. Lentzen, Microsc. Microanal., 8 (Suppl. 2) (2002) 8.
3. M. Lentzen, et al., Ultramicroscopy, 92 (2002) 233.
4. C.L. Jia, et al., Science, 299 (2003) 870.
5. M. Haider, et al., Nature, 392 (1998) 768.
6. M. Haider, et al., Ultramicroscopy, 75 (1998) 53.