Inspection allocation in manufacturing systems using stochastic search techniques

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.

Volumn 26, Issue 2, 1996, Pages 222-230

  Viswanadham, N ^a,c   Sharma, Shashi M ^a   Taneja, Mukesh ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b Department of Earth and Environmental Sciences   (United States)

^c IEEE

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; GENETIC ALGORITHMS; INSPECTION; MATHEMATICAL MODELS; PERFORMANCE; PROBLEM SOLVING; QUALITY ASSURANCE; QUALITY CONTROL; RANDOM PROCESSES; SIMULATED ANNEALING;

DEFECTIVE ITEMS; INSPECTION ALLOCATION; INSPECTION STATION; MULTISTAGE MANUFACTURING SYSTEM; PENALTY COST; SCRAPPING COST; STOCHASTIC SEARCH TECHNIQUES;

OPERATIONS RESEARCH;

EID: 0030105320     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/3468.485748     Document Type: Article

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