Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors

Electronics Letters

Volumn 39, Issue 14, 2003, Pages 1086-1088

  Zhang, J ^a   Boiadjieva, N ^d   Chulkova, G ^e   Deslandes, H ^d   Gol'tsman, G N ^e   Korneev, A ^e   Kouminov, P ^e   Leibowitz, M ^d   Lo, W ^d   Malinsky, R ^d   Okunev, O ^e   Pearlman, A ^a   Slysz, W ^a,b   Smirnov, K ^e   Tsao, C ^d   Verevkin, A ^a   Voronov, B ^e   Wilsher, K ^d   Sobolewski, R ^a,c  

^a University of Rochester ^*  (United States)

^b Institute of Electron Technology   (Poland)

^c INSTITUTE OF PHYSICS   (Poland)

^d NPTTest Inc   (United States)

^e MOSCOW STATE PEDAGOGICAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; CMOS INTEGRATED CIRCUITS; INFRARED RADIATION; LIGHT EMISSION; MOSFET DEVICES; NIOBIUM COMPOUNDS; OPTICAL COLLIMATORS; OPTICAL FIBERS; PHOTODETECTORS; SUPERCONDUCTING DEVICES; SUPERCONDUCTING TRANSITION TEMPERATURE; THICK FILMS;

NONINVASIVE CIRCUIT TESTING; PHOTON EMISSION; SUPERCONDUCTING SINGLE PHOTON DETECTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0041845126     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20030710     Document Type: Article

References (8)

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