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Volumn 512, Issue 1-2, 2003, Pages 117-128
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A high-speed low-noise transimpedance amplifier in a 0.25 μm CMOS technology
a
CERN
(Switzerland)
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Author keywords
CMOS; Deep submicron; Low temperature CMOS; Radiation tolerance; Transimpedance amplifier
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
CRYOGENICS;
ELECTRIC IMPEDANCE;
LOW TEMPERATURE EFFECTS;
PROTON BEAMS;
RADIATION DETECTORS;
RADIATION TOLERANCE;
CMOS INTEGRATED CIRCUITS;
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EID: 0041564524
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(03)01885-0 Document Type: Conference Paper |
Times cited : (24)
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References (19)
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