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Volumn 4979, Issue , 2003, Pages 137-144

Planarization of a CMOS die for an integrated metal MEMS

Author keywords

Chemical mechanical planarization; MEMS integration; MEMS mirror array; Polishing; Sputtering

Indexed keywords

ADAPTIVE OPTICS; CHEMICAL MECHANICAL POLISHING; ELECTROSTATICS; LIGHT MODULATORS; MICROELECTROMECHANICAL DEVICES; SEMICONDUCTING ALUMINUM COMPOUNDS; SILICON NITRIDE; SPUTTERING; SURFACE TOPOGRAPHY; THERMAL EFFECTS;

EID: 0041562457     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472803     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 2
    • 0027816551 scopus 로고
    • Current status of the digital micro mirror device (DMD) for projection television application
    • L. J. Hornbeck, "Current status of the digital micro mirror device (DMD) for projection television application," Technical Digest of International Electron Devices, 1993, pp. 381-384.
    • (1993) Technical Digest of International Electron Devices , pp. 381-384
    • Hornbeck, L.J.1
  • 4
    • 0031170437 scopus 로고    scopus 로고
    • Planarization techniques for vertically integrated metallic MEMS on silicon foundry circuits
    • J. B. Lee, J. English, C. H. Ahn and M. G. Allen, "Planarization techniques for vertically integrated metallic MEMS on silicon foundry circuits," Journal of Micromechanics and Microengineering, Vol. 7, 1997, pp. 44-54.
    • (1997) Journal of Micromechanics and Microengineering , vol.7 , pp. 44-54
    • Lee, J.B.1    English, J.2    Ahn, C.H.3    Allen, M.G.4
  • 8
    • 0029332398 scopus 로고
    • Low temperature chemical vapor deposition processes and dielectrics for microelectric circuit manufacturing at IBM
    • July
    • D. R. Cote, S. V. Nguyen, W. J. Cote, S. L. Pennington, A. K. Stamper and D. V. Podlesnik, "Low temperature chemical vapor deposition processes and dielectrics for microelectric circuit manufacturing at IBM," IBM Journal of Research and Development, Vol. 39, No 4, July 1995, pp. 437-463.
    • (1995) IBM Journal of Research and Development , vol.39 , Issue.4 , pp. 437-463
    • Cote, D.R.1    Nguyen, S.V.2    Cote, W.J.3    Pennington, S.L.4    Stamper, A.K.5    Podlesnik, D.V.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.