Characterization of carrier lifetime and diffusivity in 4H-SiC using time-resolved imaging spectroscopy of electroluminescence

Materials Science and Engineering: B

Volumn 102, Issue 1-3, 2003, Pages 304-307

  Galeckas, A ^a   Linnros, J ^a   Lindstedt, M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Carrier lifetime; Diffusion length; Electroluminescence; Imaging spectrometry; SiC

Indexed keywords

DEFECTS; DIFFUSION; ELECTROLUMINESCENCE; HYDROGEN; IMAGING TECHNIQUES; SPECTROMETRY; SPECTROSCOPIC ANALYSIS;

IMAGING SPECTROSCOPY;

SILICON CARBIDE;

EID: 0041429500     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00728-6     Document Type: Conference Paper

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