Error analysis for Mueller matrix measurement

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 20, Issue 8, 2003, Pages 1651-1657

  Nee, Soe Mie F ^a  

^a NAVAL AIR WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; ERROR ANALYSIS; LIGHT POLARIZATION; PARAMETER ESTIMATION;

MUELLER MATRIX;

MATRIX ALGEBRA;

EID: 0041429498     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.20.001651     Document Type: Article

References (20)

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