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Volumn 13, Issue 10, 2002, Pages 1563-1573

Error analysis and calibration of a spectroscopic Mueller matrix polarimeter using a short-pulse laser source

Author keywords

Calibration; Elliptical birefringence; Quarter waveplate; Spectroscopic polarimeter

Indexed keywords

BIREFRINGENCE; CALIBRATION; COMPUTER SIMULATION; ERROR ANALYSIS; LASER PULSES; MATRIX ALGEBRA; MEASUREMENT ERRORS; SPECTROSCOPIC ANALYSIS;

EID: 0036796908     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/13/10/309     Document Type: Article
Times cited : (14)

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  • 7
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    • Longwave properties of the orientation averaged Mueller scattering matrix for particles of arbitrary shape: I. Dependence on wavelength and scattering angle
    • (1990) J. Chem. Phys , vol.93 , pp. 5605-5615
    • Shi, Y.1    McClain, W.M.2
  • 17
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    • Intensity noise enhancement in the half-wave plate/polarizer attenuator
    • (1991) Opt. Lett , vol.16 , pp. 784-786
    • Kolner, B.H.1
  • 22
    • 0027639134 scopus 로고
    • Measurements of linear diattenuation and linear retardance spectra with a rotating sample spectropolarimeter
    • (1993) Appl. Opt , vol.32 , pp. 3513-3519
    • Chenault, D.B.1    Chipman, R.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.