HRTEM imaging of weakly scattering atom columns using a negative spherical aberration combined with an overfocus

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 932-933

  Lentzen, M ^a   Jia, C L ^a   Urban, K ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419586     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444668     Document Type: Conference Paper

References (6)

1. M. Haider et al., Optik 99 (1995) 167.
2. S. Uhlemann and M. Haider, Ultramicroscopy 72 (1998) 109.
3. M. Haider et al., Nature 392 (1998) 768.
4. H. Rose, Optik 85 (1990) 19.
5. M. Lentzen et al., Ultramicroscopy 92 (2002) 233.
6. C.L. Jia et al., Science 299 (2003) 870.