Aberration corrected Wien filter as a monochromator of high spatial and high energy resolution electron microscopes

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 944-945

  Tsuno, K ^a   Ioanoviciu, D ^b   Martinez, G ^c  

^a JEOL LTD   (Japan)

^b NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

^c UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041419563     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444723     Document Type: Conference Paper

References (4)

1. M. Tanaka et al., Microsc. Microanal. 8 (Suppl. 2) 68.
2. H. Rose, Optik 34 (1987) 26.
3. K. Tsuno and J. Rouse, J. Electron Microsc. 45 (1996) 417.
4. G. Martinez and K. Tsuno, Ultramicroscopy 93 (2002) 253.