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Volumn 9, Issue 5, 1997, Pages 16-22

Total reflection x-ray fluorescence spectrometry (TXRF) for trace element analysis

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002937566     PISSN: 09660941     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (11)
  • 8
    • 8344273663 scopus 로고    scopus 로고
    • Technical Committee ISO/TC201 Wg. 2, Final Working Draft ISO 14706
    • Technical Committee ISO/TC201 Wg. 2, Final Working Draft ISO 14706.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.