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Volumn 542, Issue 1-2, 2003, Pages 142-149

Surface state of CdTe crystals irradiated by KrF excimer laser pulses near the melting threshold

Author keywords

Atomic force microscopy; Cadmium telluride; Laser methods; Reflection high energy electron diffraction (RHEED); Surface melting; Surface structure, morphology, roughness, and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CRYSTALLIZATION; EXCIMER LASERS; MELTING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE ROUGHNESS;

EID: 0041387512     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00987-7     Document Type: Article
Times cited : (22)

References (22)
  • 20
    • 0039631433 scopus 로고
    • Transmission electron microscopy. Physics of image formation and microanalysis
    • Berlin: Springer
    • Reimer L. Transmission Electron Microscopy. Physics of Image Formation and Microanalysis. Springer Series in Optical Sciences. vol. 36:1993;Springer, Berlin.
    • (1993) Springer Series in Optical Sciences , vol.36
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.