Surface state of CdTe crystals irradiated by KrF excimer laser pulses near the melting threshold

Surface Science

Volumn 542, Issue 1-2, 2003, Pages 142-149

  Gnatyuk, V A ^a   Aoki, T ^a   Nakanishi, Y ^a   Hatanaka, Y ^b  

^a SHIZUOKA UNIVERSITY   (Japan)

^b AICHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Cadmium telluride; Laser methods; Reflection high energy electron diffraction (RHEED); Surface melting; Surface structure, morphology, roughness, and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CRYSTALLIZATION; EXCIMER LASERS; MELTING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE ROUGHNESS;

SURFACE MELTING;

SURFACE STRUCTURE;

EID: 0041387512     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00987-7     Document Type: Article

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