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Volumn 542, Issue 1-2, 2003, Pages 142-149
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Surface state of CdTe crystals irradiated by KrF excimer laser pulses near the melting threshold
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Author keywords
Atomic force microscopy; Cadmium telluride; Laser methods; Reflection high energy electron diffraction (RHEED); Surface melting; Surface structure, morphology, roughness, and topography
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CADMIUM COMPOUNDS;
CRYSTALLIZATION;
EXCIMER LASERS;
MELTING;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SURFACE ROUGHNESS;
SURFACE MELTING;
SURFACE STRUCTURE;
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EID: 0041387512
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00987-7 Document Type: Article |
Times cited : (22)
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References (22)
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