Scattering of electrons in silicon inversion layers by remote surface roughness

Journal of Applied Physics

Volumn 94, Issue 1, 2003, Pages 392-399

  Gamiz F ^a   Roldan J B ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MOBILITY; GREEN'S FUNCTION; INTERFACES (MATERIALS); LIGHT SCATTERING; MONTE CARLO METHODS; PERTURBATION TECHNIQUES; PHONONS; SILICA; SURFACE ROUGHNESS;

REMOTE SURFACE ROUGHNESS;

ELECTRON SCATTERING;

EID: 0041339899     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1577227     Document Type: Article

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