Ion migration effects in the degradation of polymeric electroluminescent devices

ACS Symposium Series

Volumn 735, Issue , 1999, Pages 144-162

  Sheats, James R ^a   Chang, Ying Lan ^a   Roitman, Daniel ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040790454     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (28)

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