Characterization of polymeric light emitting diodes by SIMS depth profiling analysis

Fresenius' Journal of Analytical Chemistry

Volumn 353, Issue 5-8, 1995, Pages 642-646

  Sauer, G ^a   Kilo, M ^a   Hund, M ^a   Wokaun, A ^a   Karg, S ^b   Meier, M ^b   Riess W ^b   Schwoerer, M ^b   Suzuki, H ^b   Simmerer, J ^b   Meyer, H ^b   Haarer, D ^b  

^a UNIVERSITY OF BAYREUTH   (Germany)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MULTILAYERS; POLYSILANES; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY;

DEPTH PROFILE; EXPERIMENTAL STUDY; IMPURITY LEVEL; LAMINATED STRUCTURE; OXADIAZOLE DERIVATIVES; PHENYLENE(VINYLENE) POLYMER;

LIGHT EMITTING DIODES;

EID: 0029206728     PISSN: 09370633     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/BF00321341     Document Type: Article

References (19)