X-ray imaging of stress and strain of diamond, iron, and tungsten at megabar pressures

Science

Volumn 276, Issue 5316, 1997, Pages 1242-1245

  Hemley, Russell J ^a   Mao, Ho Kwang ^a   Shen, Guoyin ^a,d   Badro, James ^b   Gillet, Philippe ^b   Hanfland, Michael ^c   Häusermann, Daniel ^c  

^a GEOPHYSICAL LABORATORY   (United States)

^b UNIVERSITÉ DE LYON   (France)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIAMONDS; HIGH PRESSURE ENGINEERING; IMAGING TECHNIQUES; IRON; STRESS ANALYSIS; STRESS CONCENTRATION; SYNCHROTRON RADIATION; TUNGSTEN; X RAY DIFFRACTION ANALYSIS; X RAYS; YIELD STRESS;

DIAMOND ANVIL CELL GASKETS; MEGABAR PRESSURE; RADIAL DIFFRACTION GEOMETRY; STRESS MEASUREMENT; ULTRAHIGH PRESSURE TECHNIQUES; X RAY IMAGING;

STRAIN MEASUREMENT;

DIAMOND; IRON; TUNGSTEN;

ANISOTROPY; ARTICLE; PRESSURE; PRIORITY JOURNAL; STRESS STRAIN RELATIONSHIP; SYNCHROTRON; VISCOELASTICITY; X RAY POWDER DIFFRACTION;

EID: 1842376909     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.276.5316.1242     Document Type: Article

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58. We are grateful to A. K. Singh for many useful discussions and to J. Shu for experimental help. We also thank C. Meade and two anonymous reviewers for comments that improved the manuscript. This work was supported by NSF.