The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

Journal of Applied Crystallography

Volumn 30, Issue 4, 1997, Pages 427-430

  Sanchez Bajo F ^a   Cumbrera, F L ^a  

^a UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040747394     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889896015464     Document Type: Article

References (21)

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