Influence of surface damage on highly segmented silicon detectors

Nuovo Cimento della Societa Italiana di Fisica A

Volumn 112, Issue 11, 1999, Pages 1369-1376

  Gossling C ^a   Lichau, C ^a   Peters, M ^a   Wustenfeld J ^a   Wunstorf, R ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039725157     PISSN: 03693546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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