Shallow- and deep-levels analysis in irradiated medium-resistivity silicon detectors

Nuovo Cimento della Societa Italiana di Fisica A

Volumn 112, Issue 11, 1999, Pages 1359-1367

  Borchi, E ^a,b   Bruzzi, M ^a,b   Menichelli, M ^a,b   Pirollo, S ^a,b  

^a UNIVERSITY OF FLORENCE   (Italy)

^b INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039132815     PISSN: 03693546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

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