Observation of hydrogenated silicon clusters Si6Hx with controlled hydrogen content on Si (111)-(7 × 7) surfaces

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 42, Issue 2 B, 2003, Pages

  Uchida, Noriyuki ^a   Bolotov, Leonid ^a   Kanayama, Toshihiko ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Hydrogenated silicon clusters; Ion trap; Scanning tunneling microscope; Scanning tunneling spectroscopy

Indexed keywords

ATOMS; ELECTRONIC STRUCTURE; HYDROGENATION; KINETIC ENERGY; SCANNING TUNNELING MICROSCOPY; SILICON COMPOUNDS; SURFACES; SYNTHESIS (CHEMICAL);

HYDROGENATED SILICON CLUSTERS; ION TRAP; SCANNING TUNNELING SPECTROSCOPY;

SEMICONDUCTING SILICON;

EID: 0038814674     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.42.L204     Document Type: Letter

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