Scanning tunneling microscopy studies of fullerenes

Materials Science Forum

Volumn 232, Issue , 1996, Pages 119-154

  Sakurai, T ^a   Wang, X D ^a,b   Hashizume, T ^a,c  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c HITACHI LTD   (Japan)

Author keywords

Cluster Adsorption; Fullerenes; Metallofullerenes; Scanning Tunneling Microscopy

Indexed keywords

ADSORPTION; CHEMICAL BONDS; CHEMICAL REACTIONS; CRYSTAL STRUCTURE; FILM GROWTH; GEOMETRY; INTERFACIAL ENERGY; MOLECULES; ORGANOMETALLICS; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; SURFACES;

ADATOMS; CLUSTER ADSORPTION; CORNER HOLE ATOM; DANGLING BOND; METALLOFULLERENES; REST ATOMS;

FULLERENES;

EID: 0030393505     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.232.119     Document Type: Article

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