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Volumn 206, Issue , 2003, Pages 855-860
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Defect characteristics by boron cluster ion implantation
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON;
COMPUTER SIMULATION;
ION BOMBARDMENT;
ION IMPLANTATION;
MONOMERS;
DAMAGE DENSITY;
POINT DEFECTS;
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EID: 0038750912
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)00878-4 Document Type: Conference Paper |
Times cited : (14)
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References (9)
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