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Volumn 206, Issue , 2003, Pages 855-860

Defect characteristics by boron cluster ion implantation

Author keywords

[No Author keywords available]

Indexed keywords

BORON; COMPUTER SIMULATION; ION BOMBARDMENT; ION IMPLANTATION; MONOMERS;

EID: 0038750912     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00878-4     Document Type: Conference Paper
Times cited : (14)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.