High resolution index of refraction profiling of optical waveguides

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4833, Issue , 2002, Pages 811-819

  Taylor, Rod ^a   Hnatovsky, Cyril ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Index of refraction; Index profiling; Reflection NSOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL FIBERS; REFRACTIVE INDEX;

MICROREFLECTION;

WAVEGUIDES;

EID: 0038723542     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.473921     Document Type: Conference Paper

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