Near-field scanning optical microscopy in reflection: A study of far-field collection geometry effects

Review of Scientific Instruments

Volumn 67, Issue 8, 1996, Pages 2924-2929

  Weston, Kenneth D ^a   DeAro, Jessie A ^a   Buratto, Steven K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001462153     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147073     Document Type: Article

References (16)

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